Share Email Print
cover

Proceedings Paper

Characterization of the CCD and CMOS cameras for grating-based phase-contrast tomography
Author(s): Pavel Lytaev; Alexander Hipp; Lars Lottermoser; Julia Herzen; Imke Greving; Igor Khokhriakov; Stephan Meyer-Loges; Jörn Plewka; Jörg Burmester; Michele Caselle; Matthias Vogelgesang; Suren Chilingaryan; Andreas Kopmann; Matthias Balzer; Andreas Schreyer; Felix Beckmann
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this article we present the quantitative characterization of CCD and CMOS sensors which are used at the experiments for microtomography operated by HZG at PETRA III at DESY in Hamburg, Germany. A standard commercial CCD camera is compared to a camera based on a CMOS sensor. This CMOS camera is modified for grating-based differential phase-contrast tomography. The main goal of the project is to quantify and to optimize the statistical parameters of this camera system. These key performance parameters such as readout noise, conversion gain and full-well capacity are used to define an optimized measurement for grating-based phase-contrast. First results will be shown.

Paper Details

Date Published: 15 September 2014
PDF: 10 pages
Proc. SPIE 9212, Developments in X-Ray Tomography IX, 921218 (15 September 2014); doi: 10.1117/12.2061389
Show Author Affiliations
Pavel Lytaev, Helmholtz-Zentrum Geesthacht (Germany)
Alexander Hipp, Helmholtz-Zentrum Geesthacht (Germany)
Lars Lottermoser, Helmholtz-Zentrum Geesthacht (Germany)
Julia Herzen, Technische Univ. München (Germany)
Imke Greving, Helmholtz-Zentrum Geesthacht (Germany)
Igor Khokhriakov, Helmholtz-Zentrum Geesthacht (Germany)
Stephan Meyer-Loges, Helmholtz-Zentrum Geesthacht (Germany)
Jörn Plewka, Helmholtz-Zentrum Geesthacht (Germany)
Jörg Burmester, Helmholtz-Zentrum Geesthacht (Germany)
Michele Caselle, Karlsruhe Institute of Technology (Germany)
Matthias Vogelgesang, Karlsruhe Institute of Technology (Germany)
Suren Chilingaryan, Karlsruhe Institute of Technology (Germany)
Andreas Kopmann, Karlsruhe Institute of Technology (Germany)
Matthias Balzer, Karlsruhe Institute of Technology (Germany)
Andreas Schreyer, Helmholtz-Zentrum Geesthacht (Germany)
Felix Beckmann, Helmholtz-Zentrum Geesthacht (Germany)


Published in SPIE Proceedings Vol. 9212:
Developments in X-Ray Tomography IX
Stuart R. Stock, Editor(s)

© SPIE. Terms of Use
Back to Top