Share Email Print
cover

Proceedings Paper

An error function minimization approach for the inverse problem of adaptive mirrors tuning
Author(s): Maurizio Vannoni; Fan Yang; Frank Siewert; Harald Sinn
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Adaptive x-ray optics are more and more used in synchrotron beamlines, and it is probable that they will be considered for the future high-power free-electron laser sources, as the European XFEL now under construction in Hamburg, or similar projects now in discussion. These facilities will deliver a high power x-ray beam, with an expected high heat load delivered on the optics. For this reason, bendable mirrors are required to actively compensate the resulting wavefront distortion. On top of that, the mirror could have also intrinsic surface defects, as polishing errors or mounting stresses. In order to be able to correct the mirror surface with a high precision to maintain its challenging requirements, the mirror surface is usually characterized with a high accuracy metrology to calculate the actuators pulse functions and to assess its initial shape. After that, singular value decomposition (SVD) is used to find the signals to be applied into the actuators, to reach the desired surface deformation or correction. But in some cases this approach could be not robust enough for the needed performance. We present here a comparison between the classical SVD method and an error function minimization based on root-mean-square calculation. Some examples are provided, using a simulation of the European XFEL mirrors design as a case of study, and performances of the algorithms are evaluated in order to reach the ultimate quality in different scenarios. The approach could be easily generalized to other situations as well.

Paper Details

Date Published: 5 September 2014
PDF: 7 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080I (5 September 2014); doi: 10.1117/12.2061177
Show Author Affiliations
Maurizio Vannoni, European XFEL GmbH (Germany)
Fan Yang, European XFEL GmbH (Germany)
Frank Siewert, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)
Harald Sinn, European XFEL GmbH (Germany)


Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)

© SPIE. Terms of Use
Back to Top