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Proceedings Paper

Predicting edge seal performance from accelerated testing
Author(s): Kedar Hardikar; Dan Vitkavage; Ajay Saproo; Todd Krajewski
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Paper Abstract

Degradation in performance of a PV module attributable to moisture ingress has received significant attention in PV reliability research. Assessment of field performance of PV modules against moisture ingress through product-level testing in temperature-humidity control chambers poses challenges. Development of a meaningful acceleration factor model is challenging due to different rates of degradation of components embedded in a PV module, when exposed to moisture. Test results are typically a convolution of moisture barrier performance of the edge seal and degradation of laminated components when exposed to moisture. It is desirable to have an alternate method by which moisture barrier performance of the edge seal in its end product form can be assessed in any given field conditions, independent of particular cell design. In this work, a relatively inexpensive test technique was developed to test the edge seal in its end product form in a manner that is decoupled from other components of the PV module. A theoretical framework was developed to assess moisture barrier performance of edge seal with desiccants subjected to different conditions. This framework enables the analysis of test results from accelerated tests and prediction of the field performance of the edge seal. Results from this study lead to the conclusion that the edge seal on certain Miasole glass-glass modules studied is effective for the most aggressive weather conditions examined, beyond the intended service.

Paper Details

Date Published: 8 October 2014
PDF: 9 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790N (8 October 2014); doi: 10.1117/12.2061126
Show Author Affiliations
Kedar Hardikar, Miasole Hi-Tech (United States)
Dan Vitkavage, Miasole Hi-Tech (United States)
Ajay Saproo, Miasole Hi-Tech (United States)
Todd Krajewski, Miasole Hi-Tech (United States)


Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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