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Proceedings Paper

Silicon single crystal as back-reflector for high-intensity hard x-rays
Author(s): Tom Pardini; Sébastien Boutet; Joseph Bradley; Tilo Doeppner; Luke B. Fletcher; Dennis F. Gardner; Randy M. Hill; Mark S. Hunter; Jacek Krzywinski; Marc Messerschmidt; Arthur E. Pak; Florian Quirin; Klaus Sokolowski-Tinten; Garth J. Williams; Stefan P. Hau-Riege
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Paper Abstract

At the Lawrence Livermore National Laboratory (LLNL) we have engineered a silicon prototype sample that can be used to reflect focused hard x-ray photons at high intensities in back-scattering geometry.1 Our work is motivated by the need for an all-x-ray pump-and-probe capability at X-ray Free Electron Lasers (XFELs) such as the Linac Coherent Light Source (LCSL) at SLAC. In the first phase of our project, we exposed silicon single crystal to the LCLS beam, and quantitatively studied the x-ray induced damage as a function of x-ray fluence. The damage we observed is extensive at fluences typical of pump-and-probe experiments. The conclusions drawn from our data allowed us to design and manufacture a silicon mirror that can limit the local damage, and reflect the incident beam before its single crystal structure is destroyed. In the second phase of this project we tested this prototype back-reflector at the LCLS. Preliminary results suggest that the new mirror geometry yields reproducible Bragg reflectivity at high x-ray fluences, promising a path forward for silicon single crystals as x-ray back-reflectors.

Paper Details

Date Published: 8 October 2014
PDF: 6 pages
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100D (8 October 2014); doi: 10.1117/12.2061087
Show Author Affiliations
Tom Pardini, Lawrence Livermore National Lab. (United States)
Sébastien Boutet, SLAC National Accelerator Lab. (United States)
Joseph Bradley, Lawrence Livermore National Lab. (United States)
Tilo Doeppner, Lawrence Livermore National Lab. (United States)
Luke B. Fletcher, Lawrence Livermore National Lab. (United States)
Dennis F. Gardner, JILA (United States)
Randy M. Hill, Lawrence Livermore National Lab. (United States)
Mark S. Hunter, Lawrence Livermore National Lab. (United States)
Jacek Krzywinski, SLAC National Accelerator Lab. (United States)
Marc Messerschmidt, SLAC National Accelerator Lab. (United States)
Arthur E. Pak, Lawrence Livermore National Lab. (United States)
Florian Quirin, Univ. Duisburg-Essen (Germany)
Klaus Sokolowski-Tinten, Univ. Duisburg-Essen (Germany)
Garth J. Williams, SLAC National Accelerator Lab. (United States)
Stefan P. Hau-Riege, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)

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