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Proceedings Paper

Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies
Author(s): Eric Schneller; Narendra S. Shiradkar; Camila L. Pereira; Leandro C. Fonseca; Neelkanth G. Dhere
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Paper Abstract

PV arrays of various thin film modules technologies such as CIGS, rigid single-junction amorphous Silicon (glass-to-glass package) and flexible triple-junction amorphous Silicon have been deployed for over 10 years in hot and humid climate at Florida Solar Energy Center. The performance of selected modules from each array was characterized using visual inspection, dark I-V, flasher I-V, electroluminescence and infrared imaging techniques. Performance was evaluated to determine which, if any, degradation mechanisms are a concern for the long-term reliability of this technology.

Paper Details

Date Published: 9 October 2014
PDF: 6 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 917906 (9 October 2014); doi: 10.1117/12.2060727
Show Author Affiliations
Eric Schneller, Univ. of Central Florida (United States)
Narendra S. Shiradkar, Univ. of Central Florida (United States)
Camila L. Pereira, Univ. of Central Florida (United States)
Leandro C. Fonseca, Univ. of Central Florida (United States)
Neelkanth G. Dhere, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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