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Proceedings Paper

Wavemeter uncertainty evaluation for the calibration of external cavity diode lasers
Author(s): I. Outumuro ; J. L. Valencia; J. Diz-Bugarin; J. Blanco; B. V. Dorrio
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Paper Abstract

The uncertainty of a wavemeter has been evaluated taking into account all contributions. This wavemeter was developed to give traceability to the frequency of external cavity diode lasers. These lasers were stabilized and used as light source in the assembly of a new interferometric system for the gauge block calibration. The wavemeter experimental setup is also presented and is based in a Michelson interferometer, a He-Ne laser used as a reference wavelength and a Vernier counter that allowed us to reduce the uncertainty below 1ppm.

Paper Details

Date Published: 22 August 2014
PDF: 6 pages
Proc. SPIE 9286, Second International Conference on Applications of Optics and Photonics, 92860R (22 August 2014); doi: 10.1117/12.2060658
Show Author Affiliations
I. Outumuro , Lab. Oficial de Metroloxia de Galicia (Spain)
J. L. Valencia, Lab. Oficial de Metroloxia de Galicia (Spain)
J. Diz-Bugarin, Univ. de Vigo (Spain)
J. Blanco, Univ. de Vigo (Spain)
B. V. Dorrio, Univ. de Vigo (Spain)


Published in SPIE Proceedings Vol. 9286:
Second International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. Martins Costa; Rogério Nunes Nogueira, Editor(s)

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