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Proceedings Paper

Development of split-delay x-ray optics using Si(220) crystals at SACLA
Author(s): Taito Osaka; Takashi Hirano; Makina Yabashi; Yasuhisa Sano; Kensuke Tono; Yuichi Inubushi; Takahiro Sato; Kanade Ogawa; Satoshi Matsuyama; Tetsuya Ishikawa; Kazuto Yamauchi
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Paper Abstract

We proposed a split and delay optics setup with Si(220) crystals combined with Kirkpatric-Baez mirror optics for x-ray pump-x-ray probe experiments at x-ray free-electron laser facilities. A prototype of the split-delay optics and its alignment procedure were tested at BL29XUL of SPring-8. The horizontal focal profile, measured via double-beam operation, showed good spatial overlap between the split beams with an FWHM of 100 nm, near the diffraction limit at 10 keV. High throughputs of the split-delay optics of 12% (upper) and 7.4% (lower) were obtained. The throughputs can be improved to 30% and 20% by optimizing the upper and lower central energy, respectively.

Paper Details

Date Published: 8 October 2014
PDF: 10 pages
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921009 (8 October 2014); doi: 10.1117/12.2060238
Show Author Affiliations
Taito Osaka, Osaka Univ. (Japan)
Takashi Hirano, Osaka Univ. (Japan)
Makina Yabashi, RIKEN (Japan)
Yasuhisa Sano, Osaka Univ. (Japan)
Kensuke Tono, Japan Synchrotron Radiation Research Institute (Japan)
Yuichi Inubushi, Japan Synchrotron Radiation Research Institute (Japan)
Takahiro Sato, The Univ. of Tokyo (Japan)
Kanade Ogawa, RIKEN (Japan)
Satoshi Matsuyama, Osaka Univ. (Japan)
Tetsuya Ishikawa, RIKEN (Japan)
Kazuto Yamauchi, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)

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