Share Email Print
cover

Proceedings Paper

Measurement of thickness distribution, optical constants, and roughness parameters of rough non-uniform ZnSe thin films
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 9286, Second International Conference on Applications of Optics and Photonics, 928651; doi: 10.1117/12.2060195
Show Author Affiliations
Ivan Ohlídal, Masaryk Univ. (Czech Republic)
David Nečas, Masaryk Univ. (Czech Republic)
Daniel Franta, Masaryk Univ. (Czech Republic)
Miloslav Ohlídal, Brno Univ. of Technology (Czech Republic)
Vladimír Čudek, Masaryk Univ. (Czech Republic)
Jiří Vodák, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 9286:
Second International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. Martins Costa; Rogério Nunes Nogueira, Editor(s)

© SPIE. Terms of Use
Back to Top