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Proceedings Paper

Study of real-time image denoising and hole-filling for micro-cantilever IR FPA imaging system
Author(s): Yun Feng; Yuejin Zhao; Liquan Dong; Ming Liu; Xiaohua Liu; Xiaomeng Li; Zhu Zhao; Xiaomei Yu; Mei Hui; Hong Wu
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Paper Abstract

This paper proposes and experimentally demonstrates a new denoising and hole-filling algorithm through discrete points removal and bilinear interpolation based on the bi-material cantilever FPA infrared imaging system. In practice, because of the limitation of FPA manufacturing process and optical readout system, the quality of obtained images is always not satisfying. A lot of noise and holes appear in the images, which restrict the application of the infrared imaging system. After analyzing the causes of noise and holes, an algorithm is presented to improve the quality of infrared images. Firstly, the statistic characteristics such as probability histograms of images with noise are analyzed in great detail. Then, IR images are denoised by the method of discrete points removal. Second, the holes are filled by bilinear interpolation. In this step, the reference points are found through partial derivative method instead of using the edge points of the holes simply. It can detect the real points effectively and enable the holes much closer to the true values. Finally, the algorithm is applied to different infrared images successfully. Experimental results show that the IR images can be denoised effectively and the SNRs are improved substantially. Meanwhile, the filling ratios of target holes reach as high as 95% and the visual quality is achieved well. It proves that the algorithm has the advantages of high speed, great precision and easy implement. It is a highly efficient real-time image processing algorithm for bi-material micro-cantilever FPA infrared imaging system.

Paper Details

Date Published: 7 October 2014
PDF: 9 pages
Proc. SPIE 9220, Infrared Sensors, Devices, and Applications IV, 922007 (7 October 2014); doi: 10.1117/12.2059748
Show Author Affiliations
Yun Feng, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Liquan Dong, Beijing Institute of Technology (China)
Ming Liu, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Xiaomeng Li, Beijing Institute of Technology (China)
Zhu Zhao, Beijing Institute of Technology (China)
Xiaomei Yu, Peking Univ. (China)
Mei Hui, Beijing Institute of Technology (China)
Hong Wu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9220:
Infrared Sensors, Devices, and Applications IV
Paul D. LeVan; Ashok K. Sood; Priyalal Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

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