Share Email Print

Proceedings Paper

Method to measure the actual vibrational amplitude of the tip in shear force microscope
Author(s): Chih-Chun Wei; Yuan-Chuan Lien; Wunshain S. Fann
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a method to measure the actual amplitude of the tip vibration in shear force microscope and near-field scanning optical microscope (NSOM). The method is based on the measurement of the laser light focused on and scattered by the tip. Different from the method already used in NSOM, the equilibrium point of the tip vibration is set to move and both dc and ac part of the scattering light is measured. The dc and ac data can be analyzed to give the actual vibrational amplitude.

Paper Details

Date Published: 30 March 1995
PDF: 4 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205932
Show Author Affiliations
Chih-Chun Wei, National Taiwan Univ. (Taiwan)
Yuan-Chuan Lien, National Taiwan Univ. (Taiwan)
Wunshain S. Fann, Institute of Atomic and Molecular Sciences (Taiwan)

Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

© SPIE. Terms of Use
Back to Top