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Proceedings Paper

Method to increase brightness of the tapered fiber probe for scanning near-field optical microscope
Author(s): Pei-Kuen Wei; Wunshain S. Fann
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Paper Abstract

We present a new method to improve the brightness of tapered fiber probes for near-field scanning optical microscope. The new probes are fabricated by adding high refractive index materials onto the pulled tapered fiber tips before coated with metal. With a tip size of 100 nm, the far-field optical power of the new tapered probe which has 25 nm thickness of zinc sulfide on tip end is about 5 times larger than the same sized traditional fiber probe.

Paper Details

Date Published: 30 March 1995
PDF: 11 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205927
Show Author Affiliations
Pei-Kuen Wei, Institute of Atomic and Molecular Sciences (Taiwan)
Wunshain S. Fann, Institute of Atomic and Molecular Sciences (Taiwan)


Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

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