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Proceedings Paper

Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle
Author(s): Dominique Barchiesi; Thierry Pagnot; Christian Pieralli; Daniel Van Labeke
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Paper Abstract

We propose a Fluorescent Scanning Near-Field Optical Microscope (FSNOM) based upon the measurement of the decay time of a fluorescent particle adsorbed on a SNOM tip. The purpose of the experiment is to measure the decay time variations of the fluorescent particle when the tip is scanned at a few nanometers from the surface of a sample. We describe the experimental set-up and present a theoretical model: it calculates, by a perturbation method, the variations of the life-time on a rough surface. The formalism is rapidly described and first theoretical life- time signals are presented.

Paper Details

Date Published: 30 March 1995
PDF: 11 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205916
Show Author Affiliations
Dominique Barchiesi, Univ. de Franche-Comte/CNRS (France)
Thierry Pagnot, Univ. de Franche-Comte/CNRS (France)
Christian Pieralli, Univ. de Franche-Comte/CNRS (France)
Daniel Van Labeke, Univ. de Franche-Comte/CNRS (France)


Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

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