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Proceedings Paper

Probing the forces between complementary strands of DNA with the atomic force microscope
Author(s): Vincent T. Moy; Ernst-Ludwig Florin; Matthias Rief; Horst Lehmann; Markus Ludwig; Hermann E. Gaub; Klaus Dornmair
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Paper Abstract

The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.

Paper Details

Date Published: 30 March 1995
PDF: 11 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205915
Show Author Affiliations
Vincent T. Moy, Technische Univ. Muenchen (Germany)
Ernst-Ludwig Florin, Technische Univ. Muenchen (Germany)
Matthias Rief, Technische Univ. Muenchen (Germany)
Horst Lehmann, Technische Univ. Muenchen (Germany)
Markus Ludwig, Technische Univ. Muenchen (Germany)
Hermann E. Gaub, Technische Univ. Muenchen (Germany)
Klaus Dornmair, Max-Planck-Institut fuer Psychiatrie (Germany)


Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

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