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Proceedings Paper

Dealing with faulty measurements in WLAN indoor positioning
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Paper Abstract

Recently indoor positioning methods based on WLAN signal measurements gained popularity because of high localization accuracy. These methods exploit radio maps obtained from wireless signal measurement surveys on location grids. Measurement sets from various WLAN access points are called fingerprints and characterize locations where the measurements are collected. As WLAN environments do not ensure continuous measurements availability, and faulty or rogue access points may unexpectedly change surveyed signal patterns, resiliency becomes an important issue to address using algorithmic methods. This paper first proposes a general fault model that integrates several reported models. Then performance degradations due to faults are studied for conventional fingerprinting methods. Two improvements to positioning systems are proposed for mitigating the impact of faulty measurements. The first improvement takes into account the intermittent unavailability of AP samples when calculating kNN. The second improvement allows the system to switch from a high accuracy method that works only under normal conditions, to a more resilient method whenever a high number of faults are suspected. Performance figures are provided for positioning with data surveyed from a real environment, to which varying amounts of faults have been introduced artificially.

Paper Details

Date Published: 18 February 2014
PDF: 10 pages
Proc. SPIE 9030, Mobile Devices and Multimedia: Enabling Technologies, Algorithms, and Applications 2014, 90300P (18 February 2014); doi: 10.1117/12.2058610
Show Author Affiliations
Jafet Morales, The Univ. of Texas at San Antonio (United States)
David Akopian, The Univ. of Texas at San Antonio (United States)
Sos Agaian, The Univ. of Texas at San Antonio (United States)


Published in SPIE Proceedings Vol. 9030:
Mobile Devices and Multimedia: Enabling Technologies, Algorithms, and Applications 2014
Reiner Creutzburg; David Akopian, Editor(s)

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