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Proceedings Paper

Resonator modeling by field tracing: a flexible approach for fully vectorial laser resonator modeling
Author(s): Daniel Asoubar; Frank Wyrowski; Hagen Schweitzer; Christian Hellmann; Michael Kuhn
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Paper Abstract

Nowadays lasers cover a broad spectrum of applications, like laser material processing, metrology and communications. Therefore a broad variety of different lasers, containing various active media and resonator setups, are used to provide high design flexibility. The optimization of such multi-parameter laser setups requires powerful simulation techniques. In literature mainly three practical resonator modeling techniques can be found: Rigorous techniques, e.g. the finite element method (FEM), approximated solutions based on paraxial Gaussian beam tracing by ABCD matrices and the Fox and Li algorithm are used to analyze transversal resonator modes. All of these existing approaches have in common, that only a single simulation technique is used for the whole resonator. In contrast we reformulate the scalar Fox and Li integral equation for resonator eigenmode calculation into a fully vectorial field tracing operator equation. This allows the flexible combination of different modeling techniques in different subdomains of the resonator. The work introduces the basic concepts of field tracing in resonators to calculate vectorial, transversal eigenmodes of stable and unstable resonators.

Paper Details

Date Published: 1 May 2014
PDF: 6 pages
Proc. SPIE 9135, Laser Sources and Applications II, 91350B (1 May 2014); doi: 10.1117/12.2057687
Show Author Affiliations
Daniel Asoubar, LightTrans VirtualLab UG (Germany)
Friedrich-Schiller-Univ Jena (Germany)
Frank Wyrowski, Friedrich-Schiller-Univ. Jena (Germany)
Hagen Schweitzer, LightTrans VirtualLab UG (Germany)
Christian Hellmann, LightTrans VirtualLab UG (Germany)
Michael Kuhn, LightTrans VirtualLab UG (Germany)

Published in SPIE Proceedings Vol. 9135:
Laser Sources and Applications II
Jacob I. Mackenzie; Helena JelÍnková; Takunori Taira; Marwan Abdou Ahmed, Editor(s)

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