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Proceedings Paper

Phase measuring deflectometry for thin actuated mirrors
Author(s): Tom Catling; David Brooks; Peter Doel
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Paper Abstract

In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.

Paper Details

Date Published: 18 July 2014
PDF: 6 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996
Show Author Affiliations
Tom Catling, Univ. College London (United Kingdom)
David Brooks, Univ. College London (United Kingdom)
Peter Doel, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)

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