Share Email Print
cover

Proceedings Paper

Methodology for a sub-millimeter near-field beam pattern measurement system
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Here we present the methodology and initial results for a new near-field antenna radiation measurement system for submillimeter receivers. The system is based on a 4-port vector network analyzer with two synthesized sources. This method improves on similar systems employing this technique with the use of the network analyzer, which reduces the cost and complexity of the system. Furthermore, a single set of test equipment can analyze multiple receivers with different central frequencies; the frequency range of the system is limited by the output range of the network analyzer and/or the power output of the source signal. The amplitude and phase stability of the system in one configuration at 350 GHz was measured and found to be accurate enough to permit near field antenna measurements. The proper characterization of phase drifts across multiple test configurations demonstrates system reliability. These initial results will determine parameters necessary for implementing a near-field radiation pattern measurement of a Schottky diode receiver operating between 340-360 GHz.

Paper Details

Date Published: 23 July 2014
PDF: 8 pages
Proc. SPIE 9153, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, 91533F (23 July 2014); doi: 10.1117/12.2056844
Show Author Affiliations
Kristina K. Davis, Arizona State Univ. (United States)
Chris Groppi, Arizona State Univ. (United States)
Hamdi Mani, Arizona State Univ. (United States)
Caleb Wheeler, Arizona State Univ. (United States)
Chris Walker, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 9153:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)

© SPIE. Terms of Use
Back to Top