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Proceedings Paper

Characterization of the reflectivity of various black materials
Author(s): Jennifer L. Marshall; Patrick Williams; Jean-Philippe Rheault; Travis Prochaska; Richard D. Allen; D. L. DePoy
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Paper Abstract

We present total and specular reflectance measurements of various materials that are commonly (and uncommonly) used to provide baffling and/or to minimize the effect of stray light in optical systems. More specifically, we investigate the advantage of using certain black surfaces and their role in suppressing stray light on detectors in optical systems. We measure the total reflectance of the samples over a broad wavelength range (250 < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. Additionally, we use a helium-neon laser to measure the specular reflectance of the samples at various angles. Finally, we compare these two measurements and derive the specular fraction for each sample.

Paper Details

Date Published: 8 July 2014
PDF: 8 pages
Proc. SPIE 9147, Ground-based and Airborne Instrumentation for Astronomy V, 91474F (8 July 2014); doi: 10.1117/12.2056729
Show Author Affiliations
Jennifer L. Marshall, Texas A&M Univ. (United States)
Patrick Williams, Texas A&M Univ. (United States)
Jean-Philippe Rheault, Texas A&M Univ. (United States)
Travis Prochaska, Texas A&M Univ. (United States)
Richard D. Allen, Texas A&M Univ. (United States)
D. L. DePoy, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 9147:
Ground-based and Airborne Instrumentation for Astronomy V
Suzanne K. Ramsay; Ian S. McLean; Hideki Takami, Editor(s)

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