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Proceedings Paper

Laser image denoising technique based on multi-fractal theory
Author(s): Lin Du; Huayan Sun; Weiqing Tian; Shuai Wang
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Paper Abstract

The noise of laser images is complex, which includes additive noise and multiplicative noise. Considering the features of laser images, the basic processing capacity and defects of the common algorithm, this paper introduces the fractal theory into the research of laser image denoising. The research of laser image denoising is implemented mainly through the analysis of the singularity exponent of each pixel in fractal space and the feature of multi-fractal spectrum. According to the quantitative and qualitative evaluation of the processed image, the laser image processing technique based on fractal theory not only effectively removes the complicated noise of the laser images obtained by range-gated laser active imaging system, but can also maintains the detail information when implementing the image denoising processing. For different laser images, multi-fractal denoising technique can increase SNR of the laser image at least 1~2dB compared with other denoising techniques, which basically meet the needs of the laser image denoising technique.

Paper Details

Date Published: 21 February 2014
PDF: 6 pages
Proc. SPIE 9142, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013, 91421V (21 February 2014); doi: 10.1117/12.2055779
Show Author Affiliations
Lin Du, The Academy of Equipment (China)
Huayan Sun, The Academy of Equipment (China)
Weiqing Tian, The Academy of Equipment (China)
Shuai Wang, The Academy of Equipment (China)


Published in SPIE Proceedings Vol. 9142:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013
Jorge Ojeda-Castaneda; Shensheng Han; Ping Jia; Jiancheng Fang; Dianyuan Fan; Liejia Qian; Yuqiu Gu; Xueqing Yan, Editor(s)

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