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Proceedings Paper

Measurement of pixel response functions of a fully depleted CCD
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Paper Abstract

We describe the measurement of detailed and precise Pixel Response Functions (PRFs) of a fully depleted CCD. Measurements were performed under different physical conditions, such as different wavelength light sources or CCD operating temperatures. We determined the relations between these physical conditions and the forms of the PRF. We employ two types of PRFs: one is the model PRF (mPRF) that can represent the shape of a PRF with one characteristic parameter and the other is the simulated PRF (sPRF) that is the resultant PRF from simulating physical phenomena. By using measured, model, and simulated PRFs, we determined the relations between operational parameters and the PRFs. Using the obtained relations, we can now estimate a PRF under conditions that will be encountered during the course of Nano-JASMINE observations. These estimated PRFs will be utilized in the analysis of the Nano-JASMINE data.

Paper Details

Date Published: 23 July 2014
PDF: 9 pages
Proc. SPIE 9154, High Energy, Optical, and Infrared Detectors for Astronomy VI, 91541W (23 July 2014); doi: 10.1117/12.2055582
Show Author Affiliations
Yukiyasu Kobayashi, National Astronomical Observatory of Japan (Japan)
The Univ. of Tokyo (Japan)
The Graduate Univ. for Advanced Studies (Japan)
Yoshito Niwa, National Astronomical Observatory of Japan (Japan)
Taihei Yano, National Astronomical Observatory of Japan (Japan)
The Graduate Univ. for Advanced Studies (Japan)
Naoteru Gouda, National Astronomical Observatory of Japan (Japan)
The Univ. of Tokyo (Japan)
The Graduate Univ. for Advanced Studies (Japan)
Takuji Hara, The Univ. of Tokyo (Japan)
Yoshiyuki Yamada, Kyoto Univ. (Japan)


Published in SPIE Proceedings Vol. 9154:
High Energy, Optical, and Infrared Detectors for Astronomy VI
Andrew D. Holland; James Beletic, Editor(s)

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