Share Email Print
cover

Proceedings Paper

On-line visual inspection techniques for quality control during the deinking of secondary fiber paper
Author(s): Stephen A. Jones; G. J. Awcock; R. L. Thomas; Kurt Humphrey
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of wastepaper as a raw materials within the paper making industry is steadily increasing. One of the key elements in processing wastepaper is the removal of ink. Current research in the industry is focused on the capability of measuring particle size on-line, within a paper mill environment. This paper describes the development of a prototype machine vision system for the analysis of ink particles within wastepaper pulp samples. A priori knowledge of the domain has been exploited to produce a lighting and sample presentation system which maximizes ink particle contrast within the image. The system has been used to examine samples from a pilot deinking cell at various stages of operation. This gives a wide spectrum of sample compositions typically encountered within a mill environment. One of the key areas in a fully automated analysis system is the segmentation of the images to determine ink particle content. Simple thresholding techniques provide the fast solution required to analyze the high throughput of a deinking line. Due to the large variation in image content the development of an overall segmentation strategy incorporating several algorithms is proposed. A suitable segmentation process is selected according to a priori knowledge of the sample content and speed of operation required. The performance limitations for particular algorithms have been determined to aid the selection process.

Paper Details

Date Published: 27 March 1995
PDF: 10 pages
Proc. SPIE 2423, Machine Vision Applications in Industrial Inspection III, (27 March 1995); doi: 10.1117/12.205508
Show Author Affiliations
Stephen A. Jones, Univ. of Brighton (United Kingdom)
G. J. Awcock, Univ. of Brighton (United Kingdom)
R. L. Thomas, Univ. of Brighton (United Kingdom)
Kurt Humphrey, PIRA International (United States)


Published in SPIE Proceedings Vol. 2423:
Machine Vision Applications in Industrial Inspection III
Frederick Y. Wu; Stephen S. Wilson, Editor(s)

© SPIE. Terms of Use
Back to Top