Share Email Print
cover

Proceedings Paper

The Canadian Astro-H Metrology System
Author(s): Luigi Gallo; Casey Lambert; Alex Koujelev; Stephane Gagnon; Martin Guibert
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Hard X-ray Telescopes on Astro-H have a 12-meter focal length. In order to achieve this long focal length and still fit compactly in the H-IIA launch fairing, the detectors are mounted at the end of an extendable optical bench that will be deployed in orbit. Once in operation, the spacecraft will experience distortions primarily due to thermal fluctuations in low-earth orbit and it is important that the misalignment between the telescopes and instruments is accurately measured. The Canadian Astro-H Metrology System (CAMS) is a laser alignment system that will measure optical alignment deviations. The CAMS is compact, consumes little power, and is stable over a wide temperature range. The system will be used to measure lateral (X/Y) displacement as well as rotational shifts in the optical bench. In addition, the CAMS data can be used to enhance the quality of the hard X-ray images that will have been degraded by structural deformations. A description of the CAMS hardware and the relevant data processing algorithms are provided.

Paper Details

Date Published: 24 July 2014
PDF: 10 pages
Proc. SPIE 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray, 914456 (24 July 2014); doi: 10.1117/12.2054921
Show Author Affiliations
Luigi Gallo, Saint Mary's Univ. (Canada)
Casey Lambert, Saint Mary's Univ. (Canada)
Alex Koujelev, Canadian Space Agency (Canada)
Stephane Gagnon, Neptec Design Group Ltd. (Canada)
Martin Guibert, Neptec Design Group Ltd. (Canada)


Published in SPIE Proceedings Vol. 9144:
Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray
Tadayuki Takahashi; Jan-Willem A. den Herder; Mark Bautz, Editor(s)

© SPIE. Terms of Use
Back to Top