Share Email Print
cover

Proceedings Paper

Gaia on-board metrology: basic angle and best focus
Author(s): A. Mora; M. Biermann; A. G. A. Brown; D. Busonero; L. Carminati; J. M. Carrasco; F. Chassat; M. Erdmann; W. L. M. Gielesen; C. Jordi; D. Katz; R. Kohley; L. Lindegren; W. Loeffler; O. Marchal; P. Panuzzo; G. Seabroke; J. Sahlmann; E. Serpell; I. Serraller; F. van Leeuwen; W. van Reeven; T. C. van den Dool; L. L. A. Vosteen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Gaia payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of μas (prad, micropixel), which is the highest level ever achieved in space. Two Shack- Hartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented .

Paper Details

Date Published: 2 August 2014
PDF: 18 pages
Proc. SPIE 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91430X (2 August 2014); doi: 10.1117/12.2054602
Show Author Affiliations
A. Mora, European Space Astronomy Ctr. (Spain)
Aurora Technology B.V. (Netherlands)
M. Biermann, Astronomisches Rechen-Institut (Germany)
A. G. A. Brown, Leiden Observatory, Leiden Univ. (Netherlands)
D. Busonero, INAF - Osservatorio Astrofisico di Torino (Italy)
L. Carminati, Airbus Defence and Space (France)
J. M. Carrasco, Institut del Ciències del Cosmos, Univ. de Barcelona (Spain)
F. Chassat, Airbus Defence and Space (France)
M. Erdmann, European Space Research and Technology Ctr. (Netherlands)
W. L. M. Gielesen, TNO Science and Industry (Netherlands)
C. Jordi, Institut del Ciències del Cosmos, Univ. de Barcelona (Spain)
D. Katz, GEPI, Observatoire de Paris, CNRS, Univ. Paris Diderot (France)
R. Kohley, European Space Astronomy Ctr. (Spain)
L. Lindegren, Lund Observatory, Lund Univ. (Sweden)
W. Loeffler, Astronomisches Rechen-Institut (Germany)
O. Marchal, Observatoire de Paris, CNRS, Univ. Paris Diderot (France)
P. Panuzzo, GEPI, Observatoire de Paris, CNRS, Univ. Paris Diderot (France)
G. Seabroke, Univ. College London (United Kingdom)
J. Sahlmann, European Space Astronomy Ctr. (Spain)
E. Serpell, ESA-ESOC Gaia Operations (Germany)
Telespazio VEGA Deutschland GmbH (Germany)
I. Serraller, European Space Astronomy Ctr. (Spain)
GMV S.A. (Spain)
F. van Leeuwen, Institute of Astronomy, Univ. of Cambridge (United Kingdom)
W. van Reeven, European Space Astronomy Ctr. (Spain)
Aurora Technology B.V. (Netherlands)
T. C. van den Dool, TNO Science and Industry (Netherlands)
L. L. A. Vosteen, TNO Science and Industry (Netherlands)


Published in SPIE Proceedings Vol. 9143:
Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
Jacobus M. Oschmann; Mark Clampin; Giovanni G. Fazio; Howard A. MacEwen, Editor(s)

© SPIE. Terms of Use
Back to Top