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Proceedings Paper

Wavelet transform for local tomography reconstruction
Author(s): Harold H. Szu; Joseph T. DeWitte Jr.; Joseph P. Garcia; Brian A. Telfer; Tim E. Olson; Dennis M. Healy Jr.; Rui J. P. de Figueiredo
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Paper Abstract

We propose a new experimental data acquisition method which acquires multiple exposures through a windowed x-ray radiation profile. The tapered profile is localized at the target region with a reduced radiation dosage but must be repeated at a few discrete shifts outside the target region to cover the whole slice. Such an approximated spatial window-convolution projection, a weighted-shifted radon transform, is ideally suited for the wavelet transform (WT) which is a bank of constant-Q matched filters creating a local space-scale joint representation. It is more efficient than the Fourier transform (FT) for any local signal analysis. It requires fewer basis terms and provides better signal-to-noise ratio enhancement than FT. Thus, the WT version of the central slice theorem (CST) yields an image reconstruction method. Because of the compact support and the design flexibility of the wavelet bases, this new approach has the potential of requiring fewer of the weighted x-ray projections, in which a lower radiation dosage is used, than standard tomography. Despite the sparser data set, a reconstructed image of similar quality to that created by standard FT tomography can be achieved. Moreover, the WT using the tapered radiation cuts can provide a multi-resolution feature extraction for use in artificial neural network-based automatic pattern classification.

Paper Details

Date Published: 6 April 1995
PDF: 25 pages
Proc. SPIE 2491, Wavelet Applications II, (6 April 1995); doi: 10.1117/12.205442
Show Author Affiliations
Harold H. Szu, Naval Surface Warfare Ctr. (United States)
Joseph T. DeWitte Jr., George Washington Univ. (United States)
Joseph P. Garcia, Naval Surface Warfare Ctr. (United States)
Brian A. Telfer, Naval Surface Warfare Ctr. (United States)
Tim E. Olson, Dartmouth College (United States)
Dennis M. Healy Jr., Dartmouth College (United States)
Rui J. P. de Figueiredo, Univ. of California/Irvine (United States)

Published in SPIE Proceedings Vol. 2491:
Wavelet Applications II
Harold H. Szu, Editor(s)

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