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Proceedings Paper

Fourier transform profilometry by using digital dc subtraction
Author(s): J. Wongjarern; J. Widjaja; W. Sangpech; N. Thongdee; P. Santisoonthornwat; O. Traisak; P. Chuamchaitrakool; P. Meemon
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Paper Abstract

A new method for eliminating unwanted background of Fourier transform profilometry (FTP) by using simple dc bias and background eliminations from the deformed grating images is proposed. The proposed method has an advantage over a conventional FTP in that the 3-D object profile can be accurately measured although original fundamental spectra are corrupted by a zeroth-order spectrum. Experimental verifications of the proposed method are presented.

Paper Details

Date Published: 2 June 2014
PDF: 6 pages
Proc. SPIE 9234, International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics, 923412 (2 June 2014); doi: 10.1117/12.2054138
Show Author Affiliations
J. Wongjarern, Suranaree Univ. of Technology (Thailand)
J. Widjaja, Suranaree Univ. of Technology (Thailand)
W. Sangpech, Suranaree Univ. of Technology (Thailand)
N. Thongdee, Suranaree Univ. of Technology (Thailand)
P. Santisoonthornwat, Suranaree Univ. of Technology (Thailand)
O. Traisak, Suranaree Univ. of Technology (Thailand)
P. Chuamchaitrakool, Suranaree Univ. of Technology (Thailand)
P. Meemon, Suranaree Univ. of Technology (Thailand)


Published in SPIE Proceedings Vol. 9234:
International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics
Somnuk Sirisoonthorn, Editor(s)

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