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Proceedings Paper

Pocket pumped image analysis
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Paper Abstract

The pocket pumping technique is used to detect small electron trap sites. These traps, if present, degrade CCD charge transfer efficiency. To reveal traps in the active area, a CCD is illuminated with a flat field and, before image is read out, accumulated charges are moved back and forth number of times in parallel direction. As charges are moved over a trap, an electron is removed from the original pocket and re-emitted in the following pocket. As process repeats one pocket gets depleted and the neighboring pocket gets excess of charges. As a result a dipole" signal appears on the otherwise at background level. The amplitude of the dipole signal depends on the trap pumping efficiency. This paper is focused on trap identification technique and particularly on new methods developed for this purpose. The sensor with bad segments was deliberately chosen for algorithms development and to demonstrate sensitivity and power of new methods in uncovering sensor defects.

Paper Details

Date Published: 23 July 2014
PDF: 9 pages
Proc. SPIE 9154, High Energy, Optical, and Infrared Detectors for Astronomy VI, 91541K (23 July 2014); doi: 10.1117/12.2054125
Show Author Affiliations
Ivan Kotov, Brookhaven National Lab. (United States)
Paul O'Connor, Brookhaven National Lab. (United States)
Neil Murray, The Open Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 9154:
High Energy, Optical, and Infrared Detectors for Astronomy VI
Andrew D. Holland; James Beletic, Editor(s)

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