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Proceedings Paper

Securing resource constraints embedded devices using elliptic curve cryptography
Author(s): Tony Tam; Mohamed Alfasi; Mohammad Mozumdar
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Paper Abstract

The use of smart embedded device has been growing rapidly in recent time because of miniaturization of sensors and platforms. Securing data from these embedded devices is now become one of the core challenges both in industry and research community. Being embedded, these devices have tight constraints on resources such as power, computation, memory, etc. Hence it is very difficult to implement traditional Public Key Cryptography (PKC) into these resource constrained embedded devices. Moreover, most of the public key security protocols requires both public and private key to be generated together. In contrast with this, Identity Based Encryption (IBE), a public key cryptography protocol, allows a public key to be generated from an arbitrary string and the corresponding private key to be generated later on demand. While IBE has been actively studied and widely applied in cryptography research, conventional IBE primitives are also computationally demanding and cannot be efficiently implemented on embedded system. Simplified version of the identity based encryption has proven its competence in being robust and also satisfies tight budget of the embedded platform. In this paper, we describe the choice of several parameters for implementing lightweight IBE in resource constrained embedded sensor nodes. Our implementation of IBE is built using elliptic curve cryptography (ECC).

Paper Details

Date Published: 3 June 2014
PDF: 6 pages
Proc. SPIE 9085, Sensors and Systems for Space Applications VII, 90850N (3 June 2014); doi: 10.1117/12.2053977
Show Author Affiliations
Tony Tam, California State Univ., Long Beach (United States)
Mohamed Alfasi, California State Univ., Long Beach (United States)
Mohammad Mozumdar, California State Univ., Long Beach (United States)


Published in SPIE Proceedings Vol. 9085:
Sensors and Systems for Space Applications VII
Khanh D. Pham; Joseph L. Cox, Editor(s)

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