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Proceedings Paper

Calibration methodology and performance characterization of a polarimetric hyperspectral imager
Author(s): Joel G. Holder; Jacob A. Martin; Jeremey Pitz; Joseph L. Pezzaniti; Kevin C. Gross
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Paper Abstract

Polarimetric hyperspectral imaging (P-HSI) has the potential to improve target detection, material identification, and background characterization over conventional hyperspectral imaging and polarimetric imaging. To fully exploit the spectro-polarimetric signatures captured by such an instrument, a careful calibration process is required to remove the spectrally- and polarimetrically-dependent system response (gain). Calibration of instruments operating in the long-wave infrared (LWIR, 8μm to 12 μm) is further complicated by the polarized spectral radiation generated within the instrument (offset). This paper presents a calibration methodology developed for a LWIR Telops Hyper-Cam modified for polarimetry by replacing the entrance window with a rotatable holographic wire-grid polarizer (4000 line/mm, ZnSe substrate, 350:1 extinction ratio). A standard Fourier-transform spectrometer (FTS) spectro-radiometric calibration is modified to include a Mueller-matrix approach to account for polarized transmission through and polarized selfemission from each optical interface. It is demonstrated that under the ideal polarizer assumption, two distinct blackbody measurements at polarizer angles of 0°, 45°, 90°, and 135° are sufficient to calibrate the system for apparent degree-of-linear-polarization (DoLP) measurements. Noise-equivalent s1, s2, and DoLP are quantified using a wide-area blackbody. A polarization-state generator is used to determine the Mueller deviation matrix. Finally, a realistic scene involving buildings, cars, sky radiance, and natural vegetation is presented.

Paper Details

Date Published: 21 May 2014
PDF: 10 pages
Proc. SPIE 9099, Polarization: Measurement, Analysis, and Remote Sensing XI, 90990J (21 May 2014); doi: 10.1117/12.2053783
Show Author Affiliations
Joel G. Holder, Air Force Institute of Technology (United States)
Jacob A. Martin, Air Force Institute of Technology (United States)
Jeremey Pitz, Air Force Institute of Technology (United States)
Joseph L. Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
Kevin C. Gross, Air Force Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9099:
Polarization: Measurement, Analysis, and Remote Sensing XI
David B. Chenault; Dennis H. Goldstein, Editor(s)

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