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Proceedings Paper

Method for characterization of film thickness and refractive index in volume holographic materials
Author(s): Sylvia H. Stevenson; Kirk W. Steijn
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Paper Abstract

Independent characterization of changes in film thickness and refractive index is necessary for accurate prediction of the Bragg playback conditions of volume holograms after processing. We have developed a method which uses weak holographic mirrors to characterize processing- induced swelling or shrinkage and index change in volume holographic films, and have applied this method to DuPont OmniDexTM holographic recording films. Results of these measurements are presented.

Paper Details

Date Published: 23 March 1995
PDF: 10 pages
Proc. SPIE 2405, Holographic Materials, (23 March 1995); doi: 10.1117/12.205352
Show Author Affiliations
Sylvia H. Stevenson, DuPont Holographic Materials (United States)
Kirk W. Steijn, DuPont Holographic Materials (United States)


Published in SPIE Proceedings Vol. 2405:
Holographic Materials
T. John Trout, Editor(s)

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