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Proceedings Paper

Characterization of high-contrast targets with a dual port imaging Fourier-Transform Spectrometer
Author(s): Louis Moreau; Florent M. Prel; Claude B. Roy; Fabien Dupont
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Proc. SPIE 9104, Spectral Imaging Sensor Technologies: Innovation Driving Advanced Application Capabilities, ; doi: 10.1117/12.2053413
Show Author Affiliations
Louis Moreau, ABB Analytical Measurement (Canada)
Florent M. Prel, ABB Analytical Measurement (Canada)
Claude B. Roy, ABB Analytical Measurement (Canada)
Fabien Dupont, ABB Analytical Measurement (Canada)


Published in SPIE Proceedings Vol. 9104:
Spectral Imaging Sensor Technologies: Innovation Driving Advanced Application Capabilities
David P. Bannon, Editor(s)

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