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Proceedings Paper

Structural characteristic responses for finite element model updating of structures
Author(s): Linren Zhou; Lei Wang; Jinping Ou
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Paper Abstract

The field measurements of structures are very important to the structural finite element (FE) model updating because the errors and uncertainties of a FE model are corrected directly through closing the discrepancies between the analytical responses from FE model and the measurements from field testing of a structure. Usually, the accurate and reliable field measurements are very limited. Therefore, it is very important to make full use of the limited and valuable field measurements in structural model updating to achieve a best result with the lowest cost. In this paper, structural FE model updating is investigated in the point of view of solving a mathematical problem, and different amount and category of structural dynamic responses and static responses are considered as constraints to explore their effects on the updated results of different degree and types of structural damages. The numerical studies are carried out on a space truss. Accounting for the numerical results, some inherent phenomena and connections taking account of the updating parameters, output responses and the updated results are revealed and discussed. Some useful and practicable suggestions about using the field measurements for FE model updating are provided to achieve efficient and reliable results.

Paper Details

Date Published: 10 April 2014
PDF: 9 pages
Proc. SPIE 9061, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014, 90614C (10 April 2014); doi: 10.1117/12.2053352
Show Author Affiliations
Linren Zhou, South China Univ. of Technology (China)
Lei Wang, Jinan Univ. (China)
Jinping Ou, Harbin Institute of Technology (China)
Dalian Univ. of Technology (China)

Published in SPIE Proceedings Vol. 9061:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014
Jerome P. Lynch; Kon-Well Wang; Hoon Sohn, Editor(s)

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