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Proceedings Paper

Confocal scanning beam laser microscope/macroscope: applications requiring large data sets
Author(s): Arthur E. Dixon; Savvas Damaskinos; Alfonso Ribes; Eileen Seto; Marie-Claude Beland; Tetsu Uesaka; Brian E. Dalrymple; Sid P. Duttagupta; Philippe M. Fauchet
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Paper Abstract

A new confocal scanning beam laser microscope/macroscope is described that combines the rapid scan of a scanning beam laser microscope with the large specimen capability of a scanning stage microscope. This instrument combines an infinity-corrected confocal scanning laser microscope with a scanning laser macroscope that uses a telecentric f*(theta) laser scan lens to produce a confocal imaging system with a resolution of 0.25 microns at a field of view of 50 microns to 5 microns at a field of view of 75,000 microns. The frame rate is 3 seconds per frame for a 512 X 512 pixel image, and 45 seconds for a 2048 X 2048 pixel image. Changes made in the instrument to increase the image capture from 512 X 512 pixels to 2048 X 2048 pixels are described. Applications discussed focus on three important advantages of the instrument over a confocal scanning laser microscope: an extremely wide range of magnification, the ability to record very large data sets, and the ability to image very large specimens. Examples are presented from imaging of fibers in paper, latent fingerprint detection, and reflected-light and photoluminescence imaging of porous silicon.

Paper Details

Date Published: 23 March 1995
PDF: 8 pages
Proc. SPIE 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II, (23 March 1995); doi: 10.1117/12.205331
Show Author Affiliations
Arthur E. Dixon, Univ. of Waterloo (Canada)
Savvas Damaskinos, Univ. of Waterloo (Canada)
Alfonso Ribes, Univ. of Waterloo (Canada)
Eileen Seto, Univ. of Waterloo (Canada)
Marie-Claude Beland, Paprican (Canada)
Tetsu Uesaka, Paprican (Canada)
Brian E. Dalrymple, Ontario Provincial Police (Canada)
Sid P. Duttagupta, Univ. of Rochester (United States)
Philippe M. Fauchet, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 2412:
Three-Dimensional Microscopy: Image Acquisition and Processing II
Tony Wilson; Carol J. Cogswell, Editor(s)

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