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Proceedings Paper

Light scattering in 4Pi confocal microscopy
Author(s): Martin Schrader; Stefan W. Hell; Tony Wilson
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Paper Abstract

We measure the form of the point spread function in the three main configurations of 4 Pi microscopy as well as the traditional confocal arrangement. We confirm, for the first time experimentally, the equivalence between the 4 Pi (A) and 4 Pi (B) geometries. We measure a 6.9 fold increase in axial resolution over the confocal case.

Paper Details

Date Published: 23 March 1995
PDF: 4 pages
Proc. SPIE 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II, (23 March 1995); doi: 10.1117/12.205326
Show Author Affiliations
Martin Schrader, Univ. of Oxford (United Kingdom)
Stefan W. Hell, Univ. of Oxford (United Kingdom)
Tony Wilson, Univ. of Oxford (United Kingdom)


Published in SPIE Proceedings Vol. 2412:
Three-Dimensional Microscopy: Image Acquisition and Processing II
Tony Wilson; Carol J. Cogswell, Editor(s)

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