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An overview of polarimetric sensing techniques and technology with applications to different research fields
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Paper Abstract

We report the main conclusions from an interactive, multidisciplinary workshop on “Polarimetric Techniques and Technology”, held on March 24-28 2014 at the Lorentz Center in Leiden, the Netherlands. The work- shop brought together polarimetrists from different research fields. Participants had backgrounds ranging from academia to industrial RD. Here we provide an overview of polarimetric instrumentation in the optical regime geared towards a wide range of applications: atmospheric remote sensing, target detection, astronomy, biomedical applications, etc. We identify common approaches and challenges. We list novel polarimetric techniques and polarization technologies that enable promising new solutions. We conclude with recommendations to the polarimetric community at large on joint efforts for exchanging expertise.

Paper Details

Date Published: 21 May 2014
PDF: 20 pages
Proc. SPIE 9099, Polarization: Measurement, Analysis, and Remote Sensing XI, 90990B (21 May 2014); doi: 10.1117/12.2053245
Show Author Affiliations
Frans Snik, Leiden Univ. (Netherlands)
Julia Craven-Jones, Sandia National Labs. (United States)
Michael Escuti, North Carolina State Univ. (United States)
Silvano Fineschi, INAF - Osservatorio Astronomico di Torino (Italy)
David Harrington, Univ. of Hawai'i at Manoa (United States)
Antonello De Martino, Ecole Polytechnique (France)
Dimitri Mawet, European Southern Observatory (Chile)
Jérôme Riedi, Univ. des Sciences et Technologies de Lille (France)
J. Scott Tyo, College of Optical Sciences, The Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 9099:
Polarization: Measurement, Analysis, and Remote Sensing XI
David B. Chenault; Dennis H. Goldstein, Editor(s)

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