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Proceedings Paper

Multiple-wave diffraction in x-ray interferometers
Author(s): Mykola Raransky; Vitaliy Balazyuk; Mykola Melnyk; Olga Kniginitska; Mykhailo Gunko; Maria Kshevetska
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Paper Abstract

Analysis of multiple-wave diffraction in multi-unit X-ray interferometers is made. Geometry of multiple-wave diffractions and X-ray reflection factors Rm (t) are analyzed. Experimental moiré patterns for the case of LLLinterferometer at (000, 220, 022) diffraction are obtained. The advantages of multiple-wave diffraction in the determination of displacement and strain vector components as well the Burgers vector components are highlighted.

Paper Details

Date Published: 17 December 2013
PDF: 6 pages
Proc. SPIE 9066, Eleventh International Conference on Correlation Optics, 90661B (17 December 2013); doi: 10.1117/12.2053240
Show Author Affiliations
Mykola Raransky, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Vitaliy Balazyuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Mykola Melnyk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Olga Kniginitska, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Mykhailo Gunko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Maria Kshevetska, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 9066:
Eleventh International Conference on Correlation Optics
Oleg Vyacheslavovich Angelsky, Editor(s)

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