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Proceedings Paper

Polarization in a snap: imaging polarimetry with micropolarizer arrays
Author(s): Dmitry Vorobiev; Zoran Ninkov; Michael Gartley
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Paper Abstract

Polarization, flux, and the spectral energy distribution of light are the fundamental parameters that we measure in order to infer properties of the sources of electromagnetic radiation, such as intensity, temperature, chemical composition and physical geometry. Recently, the fabrication of microgrid polarizer arrays (MPAs) facilitated the development of a new class of division-of-focal plane polarimeters. These devices are capable of measuring the degree and angle of polarization across a scene with a single exposure. We present the design of the Rochester Institute of Technology Polarization Imaging Camera (RITPIC), a snapshot polarimeter for visible and near-infrared remote sensing applications. RITPIC is a compact, light-weight and mechanically robust imaging polarimeter that is deployable on terrestrial, naval, airborne and space-based platforms. RITPIC is developed using commercially available components and is capable of fast cadence imaging polarimetry of a wide variety of scenes. We derive the expected performance of RITPIC using the first high resolution 3D finite-difference time-domain (FDTD) models of these hybrid focal planes and simulated observations of synthetic scenes rendered with the Digital Imaging and Remote Sensing Image Generation (DIRSIG) model. Furthermore, we explore applications in remote sensing for which RITPIC, and devices like it, provide unique advantages.

Paper Details

Date Published: 21 May 2014
PDF: 15 pages
Proc. SPIE 9099, Polarization: Measurement, Analysis, and Remote Sensing XI, 909904 (21 May 2014); doi: 10.1117/12.2053164
Show Author Affiliations
Dmitry Vorobiev, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)
Michael Gartley, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9099:
Polarization: Measurement, Analysis, and Remote Sensing XI
David B. Chenault; Dennis H. Goldstein, Editor(s)

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