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Proceedings Paper

Predicted NETD performance of a polarized infrared imaging sensor
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Paper Abstract

Polarization filters are commonly used as a means of increasing the contrast of a scene thereby increasing sensor range performance. The change in the signal to noise ratio (SNR) is a function of the polarization of the target and background, the type and orientation of the polarization filter(s), and the overall transparency of the filter. However, in the mid-wave and longwave infrared bands (MWIR and LWIR), the noise equivalent temperature difference (NETD), which directly affects the SNR, is a function of the filter’s re-emission and its reflected temperature radiance. This paper presents a model, by means of a Stokes vector input, that can be incorporated into the Night Vision Integrated Performance Model (NV-IPM) in order to predict the change in SNR, NETD, and noise equivalent irradiance (NEI) for infrared polarimeter imaging systems. The model is then used to conduct a SNR trade study, using a modeled Stokes vector input, for a notional system looking at a reference target. Future laboratory and field measurements conducted at Night Vision Electronic Sensors Directorate (NVESD) will be used to update, validate, and mature the model of conventional infrared systems equipped with polarization filters.

Paper Details

Date Published: 29 May 2014
PDF: 10 pages
Proc. SPIE 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV, 90710C (29 May 2014); doi: 10.1117/12.2052960
Show Author Affiliations
Bradley Preece, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Van A. Hodgkin, U.S. Army RDECOM CERDEC NVESD (United States)
Roger Thompson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Kevin Leonard, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Keith Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 9071:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
Gerald C. Holst; Keith A. Krapels; Gary H. Ballard; James A. Buford; R. Lee Murrer, Editor(s)

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