Share Email Print
cover

Proceedings Paper

3D-optical measurement system using a new vignetting aperture procedure
Author(s): Engelbert Hofbauer; Rolf Rascher; Konrad Wühr; Felix Friedke; Thomas Stubenrauch; Benjamin Pastötter; Sebastian Schleich; Christine Zöcke
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A newly developed measuring procedure uses vignetting to evaluate angles and angle changes, independently from the measurement distance. Further on, the same procedure enables the transmission of a digital readout and therefore a better automation of the electronic signal evaluation, for use as an alignment telescope. The fully extended readout by a simple 3-D reflector will provide the user with a measurement result with six degrees of freedom. The vignetting field stop procedure will be described. Firstly, considering artificial vignetting, the theoretical basics from geometric-optical view are represented. Secondly, the natural vignetting with photometric effects will be considered. The distribution of intensity in the image plane light spot, the so-called V-SPOT, is analytically deduced as a function of differently measured variables. Intensity shifts within the V-Spot are examined independently from different effects by numeric simulation. On these basics, the theoretical research regarding accuracy, linearity as well as results in 2 dimensional surface reconstruction on precision optical mirrors and also three dimensional measurements in mechanical engineering are examined. Effects and deviations will be discussed. The project WiPoVi is sponsored by “Ingenieur Nachwuchs – Qualifizierung von Ingenieurnachwuchs an Fachhochschulen” by Bavarian State Ministry of Education, Science and the Arts.

Paper Details

Date Published: 1 May 2014
PDF: 14 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 913206 (1 May 2014); doi: 10.1117/12.2052631
Show Author Affiliations
Engelbert Hofbauer, Technische Hochschule Deggendorf (Germany)
Rolf Rascher, Technische Hochschule Deggendorf (Germany)
Konrad Wühr, Technische Hochschule Deggendorf (Germany)
Felix Friedke, Technische Hochschule Deggendorf (Germany)
Thomas Stubenrauch, Technische Hochschule Deggendorf (Germany)
Benjamin Pastötter, Technische Hochschule Deggendorf (Germany)
Sebastian Schleich, Prüftechnik Alignment Systems GmbH (Germany)
Christine Zöcke, Prüftechnik Alignment Systems GmbH (Germany)


Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

© SPIE. Terms of Use
Back to Top