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Proceedings Paper

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate
Author(s): Stefan Prorok; Marvin Schulz; Alexander Petrov; Manfred Eich; Jingdong Luo; Alex K.-Y. Jen
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Paper Abstract

In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates.

Paper Details

Date Published: 1 May 2014
PDF: 10 pages
Proc. SPIE 9137, Organic Photonics VI, 91371H (1 May 2014); doi: 10.1117/12.2052616
Show Author Affiliations
Stefan Prorok, Technische Univ. Hamburg-Harburg (Germany)
Marvin Schulz, Technische Univ. Hamburg-Harburg (Germany)
Alexander Petrov, Technische Univ. Hamburg-Harburg (Germany)
Manfred Eich, Technische Univ. Hamburg-Harburg (Germany)
Jingdong Luo, Univ. of Washington (United States)
Alex K.-Y. Jen, Univ. of Washington (United States)


Published in SPIE Proceedings Vol. 9137:
Organic Photonics VI
Barry P. Rand; Chihaya Adachi; David Cheyns; Volker van Elsbergen, Editor(s)

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