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Proceedings Paper

High resolution laser remote imaging innovative tools for preservation of painted surfaces: information from reflectance and fluorescence data
Author(s): R. Fantoni; M. Ferri de Collibus; M. Francucci; G. Fornetti; M. Guarneri; L. Caneve; F. Colao; L. Fiorani; A. Palucci; V. Spizzichino
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Paper Abstract

Two innovative laser scanning prototypes have been developed at ENEA for diagnostics of large surfaces relevant to monumental cultural heritage. The first, based on amplitude modulation technique in the visible, is a trichromatic (Red /Green /Blue) imaging topologic radar (RGB-ITR) specialized to collect high resolution 3D models. After proper color calibration, it allows for hyper-realistic rendering of colored features on painted surfaces and for precise localization of irregularities. The second is a line scanning system, working either in reflectance or laser induced fluorescence mode, capable of fast 2D monochromatic images acquisition on up to 90 different spectral channels in the visible/UV range, which was developed to investigate the presence of different substances onto the painted surface. Data collected during former field campaigns on frescos by means each scanning system will be reported and discussed extracting information of interest to conservators by means of specific data processing methodologies and respective software tools. Recent results relevant to paints of the Assumption on slate and canvas by Scipione Pulzone named “il Gaetano” collected in two churches in Rome (San Silvestro al Quirinale, Bandini chapel; Santa Caterina dei Funari, Solano della Vetera Chapel) from the late XVI century are presented in order to demonstrate the increased diagnostic capabilities coming from data integration. From combination of reflectance data from both instruments, the first true remote differential colorimetry has been implemented, giving a chance to test the color quality in the future from the archived images.

Paper Details

Date Published: 28 November 2013
PDF: 10 pages
Proc. SPIE 9065, Fundamentals of Laser-Assisted Micro- and Nanotechnologies 2013, 90650Z (28 November 2013); doi: 10.1117/12.2052539
Show Author Affiliations
R. Fantoni, ENEA (Italy)
M. Ferri de Collibus, ENEA (Italy)
M. Francucci, ENEA (Italy)
G. Fornetti, ENEA (Italy)
M. Guarneri, ENEA (Italy)
L. Caneve, ENEA (Italy)
F. Colao, ENEA (Italy)
L. Fiorani, ENEA (Italy)
A. Palucci, ENEA (Italy)
V. Spizzichino, ENEA (Italy)


Published in SPIE Proceedings Vol. 9065:
Fundamentals of Laser-Assisted Micro- and Nanotechnologies 2013
Vadim P. Veiko; Tigran A. Vartanyan, Editor(s)

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