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Proceedings Paper

High-frequency sub-wavelength IR thermal source
Author(s): Floria Ottonello Briano; Pauline Renoux; Fredrik Forsberg; Hans Sohlström; Snorri Ingvarsson; Göran Stemme; Kristinn B. Gylfason
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Paper Abstract

We present a method to characterize the temperature dynamics of miniaturized thermal IR sources. The method circumvents the limitations of current IR photodetectors, by relying only on an electrical measurement rather than on optical detection. Thus, it enables the characterization of the light emission of IR sources over their full operation frequency range. Moreover, we develop a model of thermal IR sources allowing simulations of their thermal and electrical behavior. By combining measurements and modeling, we achieve a comprehensive characterization of a Pt nanowire IR source: the reference resistance R0 = 17.7Ω, the TCR α = 2.0 × 10-3 K-1, the thermal mass C = 2.7 × 10-14 J/K, and the thermal conductance G = 1.3 × 10-6 W/K. The thermal time constant could not be measured, because of the frequency limitation of our setup. However, the operation of the source has been tested and proved to function up to 1 MHz, indicating that the thermal time constant of the source is smaller than 1 μs.

Paper Details

Date Published: 1 May 2014
PDF: 6 pages
Proc. SPIE 9133, Silicon Photonics and Photonic Integrated Circuits IV, 91331D (1 May 2014); doi: 10.1117/12.2052457
Show Author Affiliations
Floria Ottonello Briano, KTH Royal Institute of Technology (Sweden)
Pauline Renoux, Univ. of Iceland (Iceland)
Fredrik Forsberg, KTH Royal Institute of Technology (Sweden)
Hans Sohlström, KTH Royal Institute of Technology (Sweden)
Snorri Ingvarsson, Univ. of Iceland (Iceland)
Göran Stemme, KTH Royal Institute of Technology (Sweden)
Kristinn B. Gylfason, KTH Royal Institute of Technology (Sweden)


Published in SPIE Proceedings Vol. 9133:
Silicon Photonics and Photonic Integrated Circuits IV
Laurent Vivien; Seppo Honkanen; Lorenzo Pavesi; Stefano Pelli; Jung Hun Shin, Editor(s)

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