Share Email Print

Proceedings Paper

Beyond the standard approximations: an analysis leading to a correct description of phase instabilities in semiconductor lasers
Author(s): L. Gil; G. L. Lippi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Following an overview of modeling of (longitudinal) multimode semiconductor laser dynamics, we analyze in detail a model proposed in 2006 to explain deterministic, phase-locked modal alternation, experimentally observed a decade ago. Through a stability analysis, we prove that the numerically obtained electromagnetic field evolution, interpreted as an explanation of the experiments, is nothing more than an extremely long transient, so long as to be hardly identifiable in an entirely numerical approach. Comparison with a model we have recently derived, which predicts a phase instability (Benjamin-Feir-like) compatible with the experimental observations, highlights the crucial ingredient for the dynamics. The wide spectrum of unstable eigenvalues accompanying the phase instability plays the role of an equivalent noise in a fully deterministic description, thus reconciling the heuristic models which could qualitatively reproduce the experimental observation either with deterministic equations in the presence of mode-coupling, or through stochastically driven modal decompositions.

Paper Details

Date Published: 2 May 2014
PDF: 11 pages
Proc. SPIE 9134, Semiconductor Lasers and Laser Dynamics VI, 913413 (2 May 2014); doi: 10.1117/12.2052258
Show Author Affiliations
L. Gil, Institut Non Linéaire de Nice Sophia Antipolis, CNRS, Univ. de Nice Sophia Antipolis (France)
G. L. Lippi, Institut Non Linéaire de Nice Sophia Antipolis, CNRS, Univ. de Nice Sophia Antipolis (France)

Published in SPIE Proceedings Vol. 9134:
Semiconductor Lasers and Laser Dynamics VI
Krassimir Panajotov; Marc Sciamanna; Angel Valle; Rainer Michalzik, Editor(s)

© SPIE. Terms of Use
Back to Top