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Proceedings Paper

Optical diffraction tomography: accuracy of an off-axis reconstruction
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Paper Abstract

Optical diffraction tomography is an increasingly popular method that allows for reconstruction of three-dimensional refractive index distribution of semi-transparent samples using multiple measurements of an optical field transmitted through the sample for various illumination directions. The process of assembly of the angular measurements is usually performed with one of two methods: filtered backprojection (FBPJ) or filtered backpropagation (FBPP) tomographic reconstruction algorithm. The former approach, although conceptually very simple, provides an accurate reconstruction for the object regions located close to the plane of focus. However, since FBPJ ignores diffraction, its use for spatially extended structures is arguable. According to the theory of scattering, more precise restoration of a 3D structure shall be achieved with the FBPP algorithm, which unlike the former approach incorporates diffraction. It is believed that with this method one is allowed to obtain a high accuracy reconstruction in a large measurement volume exceeding depth of focus of an imaging system. However, some studies have suggested that a considerable improvement of the FBPP results can be achieved with prior propagation of the transmitted fields back to the centre of the object. This, supposedly, enables reduction of errors due to approximated diffraction formulas used in FBPP. In our view this finding casts doubt on quality of the FBPP reconstruction in the regions far from the rotation axis. The objective of this paper is to investigate limitation of the FBPP algorithm in terms of an off-axis reconstruction and compare its performance with the FBPJ approach. Moreover, in this work we propose some modifications to the FBPP algorithm that allow for more precise restoration of a sample structure in off-axis locations. The research is based on extensive numerical simulations supported with wave-propagation method.

Paper Details

Date Published: 1 May 2014
PDF: 12 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320M (1 May 2014); doi: 10.1117/12.2052227
Show Author Affiliations
Julianna Kostencka, Warsaw Univ. of Technology (Poland)
Tomasz Kozacki, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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