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Proceedings Paper

Time-frequency analysis in optical coherence tomography for technical objects examination
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Paper Abstract

Optical coherence tomography (OCT) is one of the most advanced optical measurement techniques for complex structure visualization. The advantages of OCT have been used for surface and subsurface defect detection in composite materials, polymers, ceramics, non-metallic protective coatings, and many more. Our research activity has been focused on timefrequency spectroscopic analysis in OCT. It is based on time resolved spectral analysis of the backscattered optical signal delivered by the OCT. The time-frequency method gives spectral characteristic of optical radiation backscattered or backreflected from the particular points inside the tested device. This provides more information about the sample, which are useful for further analysis. Nowadays, the applications of spectroscopic analysis for composite layers characterization or tissue recognition have been reported. During our studies we have found new applications of spectroscopic analysis. We have used this method for thickness estimation of thin films, which are under the resolution of OCT. Also, we have combined the spectroscopic analysis with polarization sensitive OCT (PS-OCT). This approach enables to obtain a multiorder retardation value directly and may become a breakthrough in PS-OCT measurements of highly birefringent media. In this work, we present the time-frequency spectroscopic algorithms and their applications for OCT. Also, the theoretical simulations and measurement validation of this method are shown.

Paper Details

Date Published: 1 May 2014
PDF: 8 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320N (1 May 2014); doi: 10.1117/12.2052142
Show Author Affiliations
Marcin R. Strąkowski, Gdansk Univ. of Technology (Poland)
Maciej Kraszewski, Gdansk Univ. of Technology (Poland)
Michał Trojanowski, Gdansk Univ. of Technology (Poland)
Jerzy Pluciński, Gdansk Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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