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Proceedings Paper

Remote laboratory for phase-aided 3D microscopic imaging and metrology
Author(s): Meng Wang; Yongkai Yin; Zeyi Liu; Wenqi He; Boqun Li; Xiang Peng
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Paper Abstract

In this paper, the establishment of a remote laboratory for phase-aided 3D microscopic imaging and metrology is presented. Proposed remote laboratory consists of three major components, including the network-based infrastructure for remote control and data management, the identity verification scheme for user authentication and management, and the local experimental system for phase-aided 3D microscopic imaging and metrology. The virtual network computer (VNC) is introduced to remotely control the 3D microscopic imaging system. Data storage and management are handled through the open source project eSciDoc. Considering the security of remote laboratory, the fingerprint is used for authentication with an optical joint transform correlation (JTC) system. The phase-aided fringe projection 3D microscope (FP-3DM), which can be remotely controlled, is employed to achieve the 3D imaging and metrology of micro objects.

Paper Details

Date Published: 1 May 2014
PDF: 7 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 913205 (1 May 2014); doi: 10.1117/12.2052068
Show Author Affiliations
Meng Wang, Shenzhen Univ. (China)
Yongkai Yin, Shenzhen Univ. (China)
Zeyi Liu, Shenzhen Univ. (China)
Wenqi He, Shenzhen Univ. (China)
Boqun Li, Shenzhen Univ. (China)
Xiang Peng, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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