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Proceedings Paper

Linear electro-optical scattering from ferroelectric nanocrystals
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Paper Abstract

We report on the linear electro-optical scattering response from individual ferroelectric (KTiOPO4) nano-crystals. The newly developed Pockels Linear Electro-Optical Microscopy (PLEOM)1-3 is used in this context to map the second-order susceptibility χ(2) of non-centrosymmetric materials with a high sensitivity due to a stabilized interferometric homodyne detection. The random spatial orientation of single nano-crystals (with an average size of 150 nm), together with the orientation of the electric dipole moment of ferroelectric domains can be jointly inferred from the intensity polarization plots together with phase of the linear electro-optical response. Down- scaling the electro-optic response to nano-crystals opens-up new applications towards sub-diffraction electro-optic nano-labels for nonlinear microscopy with applications to nano-sciences and biophotonics. By using a low power He-Ne laser source and a low intensity illumination beam, PLEOM bears the potential of a new low-cost non-imaging method in biology, especially relevant for sensitive samples.

Paper Details

Date Published: 1 May 2014
PDF: 6 pages
Proc. SPIE 9136, Nonlinear Optics and Its Applications VIII; and Quantum Optics III, 91361J (1 May 2014); doi: 10.1117/12.2051911
Show Author Affiliations
Duc Thien Trinh, Lab. de Photonique Quantique et Moléculaire, CNRS (France)
Institut D'Alembert, Ecole Normale Supérieure de Cachan (France)
Hanoi National Univ. of Education (Viet Nam)
Vasyl Shynkar, Lab. de Photonique Quantique et Moléculaire, CNRS (France)
Institut D'Alembert, Ecole Normale Supérieure de Cachan (France)
Joseph Zyss, Lab. de Photonique Quantique et Moléculaire, CNRS (France)
Institut D'Alembert, Ecole Normale Supérieure de Cachan (France)


Published in SPIE Proceedings Vol. 9136:
Nonlinear Optics and Its Applications VIII; and Quantum Optics III
Benjamin J. Eggleton; Alexander V. Sergienko; Arno Rauschenbeutel; Alexander L. Gaeta; Neil G. R. Broderick; Thomas Durt, Editor(s)

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