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Proceedings Paper

Radar cross section measurements of frequency selective terahertz retroreflectors
Author(s): Richard J. Williams; Andrew J. Gatesman; Thomas M. Goyette; Robert H. Giles
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Paper Abstract

The radar cross section of spherical retroreflectors operating at terahertz frequencies is investigated. Several spherical retroreflectors with diameters ranging from 2 mm to 8 mm were fabricated and their radar cross section was measured at 100 GHz, 160 GHz, and 350 GHz. A frequency selective surface was applied to the retroreflectors to demonstrate proof of concept of narrow-band terahertz retroreflection.

Paper Details

Date Published: 21 May 2014
PDF: 13 pages
Proc. SPIE 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense, 91020R (21 May 2014); doi: 10.1117/12.2051802
Show Author Affiliations
Richard J. Williams, Univ. of Massachusetts Lowell (United States)
Andrew J. Gatesman, Univ. of Massachusetts Lowell (United States)
Thomas M. Goyette, Univ. of Massachusetts Lowell (United States)
Robert H. Giles, Univ. of Massachusetts Lowell (United States)


Published in SPIE Proceedings Vol. 9102:
Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense
Mehdi F. Anwar; Thomas W. Crowe; Tariq Manzur, Editor(s)

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