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Proceedings Paper

Surface and volumetric backscattering between 100 GHz and 1.6 THz
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Paper Abstract

Successful development of remote sensing and communication systems in the terahertz band requires a better understanding of the scattering behavior of various structures. Materials that could be considered homogeneous and smooth at microwave frequencies may begin to display surface and volumetric scattering behavior in the terahertz band. The co-polarization backscattering coefficient of several types of metal and dielectric structures were measured in indoor compact radar ranges operating at 100 GHz, 160 GHz, 240 GHz, and 1.55 THz. These structures consisted of roughened aluminum plates, as well as homogeneous and inhomogeneous dielectric surfaces. The roughness and inclusions of the measured samples were tailored in order to systematically investigate various scattering effects. Polarimetric backscattering measurements of these materials were collected at elevation angles from 5 to 75 degrees. Analysis of the backscatter data supports a better understanding of surface and volumetric scattering behavior of materials at terahertz frequencies.

Paper Details

Date Published: 9 June 2014
PDF: 15 pages
Proc. SPIE 9078, Passive and Active Millimeter-Wave Imaging XVII, 90780A (9 June 2014); doi: 10.1117/12.2051772
Show Author Affiliations
D. A. DiGiovanni, Univ. of Massachusetts Lowell (United States)
Andrew J. Gatesman, Univ. of Massachusetts Lowell (United States)
T. M. Goyette, Univ. of Massachusetts Lowell (United States)
R. H. Giles, Univ. of Massachusetts Lowell (United States)


Published in SPIE Proceedings Vol. 9078:
Passive and Active Millimeter-Wave Imaging XVII
David A. Wikner; Arttu R. Luukanen, Editor(s)

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