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Proceedings Paper

Quantitative estimate of fs-laser induced refractive index changes in the bulk of various transparent materials
Author(s): A. Mermillod-Blondin; T. Seuthe; M. Eberstein; M. Grehn; J. Bonse; A. Rosenfeld
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Paper Abstract

Over the past years, many applications based on laser-induced refractive index changes in the volume of transparent materials have been demonstrated. Ultrashort pulse lasers offer the possibility to process bulky transparent materials in three dimensions, suggesting that direct laser writing will play a decisive role in the development of integrated micro-optics. At the present time, applications such as 3D long term data storage or embedded laser marking are already into the phase of industrial development. However, a quantitative estimate of the laser-induced refractive index change is still very challenging to obtain. On another hand, several microscopy techniques have been recently developed to characterize bulk refractive index changes in-situ. They have been mostly applied to biological purposes. Among those, spatial light interference microscopy (SLIM), offers a very good robustness with minimal post acquisition data processing. In this paper, we report on using SLIM to measure fs-laser induced refractive index changes in different common glassy materials, such as fused silica and borofloat glass (B33). The advantages of SLIM over classical phase-contrast microscopy are discussed.

Paper Details

Date Published: 1 May 2014
PDF: 6 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320X (1 May 2014); doi: 10.1117/12.2051590
Show Author Affiliations
A. Mermillod-Blondin, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
T. Seuthe, Fraunhofer-Institut für Keramische Technologien und Systeme (Germany)
M. Eberstein, Fraunhofer-Institut für Keramische Technologien und Systeme (Germany)
M. Grehn, Technische Univ. Berlin (Germany)
J. Bonse, Bundesanstalt für Materialforschung und -prüfung (Germany)
A. Rosenfeld, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)


Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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