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Proceedings Paper

Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement
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Paper Abstract

This paper presents a thorough comparison between the digital-light-processing (DLP) technology and liquid-crystal-onsilicon (LCoS) technology on high-quality 3D shape measurement. Specifically, we will study not only each individual color, but also the combination of different color (i.e., white light). The binary defocusing and focused sinusoidal fringe projection methods will be evaluated under all these scenarios. Experimental data demonstrated that for slow speed measurements, DLP has better fringe contrast and thus higher signal to noise ratio (SNR) for better quality 3D shape measurement when the binary defocusing method is employed, or when proper synchronization is present when the focus sinusoidal method is used; and LCoS provides more flexibility for system development when the focus sinusoidal method is employed.

Paper Details

Date Published: 28 May 2014
PDF: 9 pages
Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 911004 (28 May 2014); doi: 10.1117/12.2050786
Show Author Affiliations
Chen Gong, Iowa State Univ. (United States)
Beiwen Li, Iowa State Univ. (United States)
Kevin G. Harding, GE Global Research (United States)
Song Zhang, Iowa State Univ. (United States)


Published in SPIE Proceedings Vol. 9110:
Dimensional Optical Metrology and Inspection for Practical Applications III
Kevin G. Harding; Toru Yoshizawa, Editor(s)

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